INFORMATION
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Scanner Based In-Line & Desktop
AOI – Inspection of low, medium & high volume surface mount & thru hole technology. Model - SS15000-PAL & SS20000-PAL |
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Scanner Based Desktop Image Comparator
– Inspection of low & medium volume surface mount & thru hole technology. Drawer & Toploader assemblies. Model - SS15000-IC |
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Line Scan Based Desktop AOI
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In-line
and off-line Paste Inspection
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Focal Spot X Ray Inspection - |
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USB Video Microscope
– Electronics, Medical, Forensics. |
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Hirox BGA Inspection System
– Inspection of BGA & Micro BGA Devices for the Electronics Industry. |
Download
the latest brochures and information on future events such as exhibitions,
press releases and new product launches.
PARTNERS
Our equipment
partners in Europe, the US and Asia are specialists in the fields of inspection,
test and service, with over fifty years experience and a large number
of high profile installations worldwide.
Copyright © 2005 Yeild Enhancement Systems Ltd. All rights reserved.